Home    Products    What's New    Sales\Support    Measurements    Resources    About Us     Contact Us

 
Resources

Tutorial

FAQ

Publications

Short Course

Site Map

Visitors

Links
 

 
J. A. Woollam Ellipsometry Short Courses


J.A. Woollam Co., Inc.
Short Course 2005

Short courses focus on data analysis methods for spectroscopic ellipsometry with a significant amount of "hands-on" computer time.  Familiarity with the J.A. Woollam WVASE32® software is recommended, but all will benefit from this through course on spectroscopic ellipsometry.    All sessions will be taught by applications engineers from the J. A. Woollam Company.  
Day 1: Intro to Ellipsometry
  • Basic theory
  • Instrumentation & data acquisition
  • Fundamentals of optical constants
  • Overview of data analysis strategies

Day 3: Intermediate Modeling

  • Dispersion Models- theory
  • Generalized Oscillator Layer
  • Analyzing absorbing films

 
Day 2: Ellipsometry Analysis
  • More Transparent Layers
    • Cauchy dispersion
    • Global Fitting
    • Roughness
    • Simple Index Grading
  • Transparent and Absorbing films
    • Point-by-Point Fitting

     

Day 4: Advanced Analysis

  • Anisotropic Data Analysis

  • Depolarization

  • Complex grading

*Day 4 will feature a series of short discussions on a wide variety of topics.  We will also include software and hardware demonstrations.  

 
 

J. A. Woollam Ellipsometry 2005 Short Courses
Date Location
June 6 - 9 Lincoln, Nebraska
September 26 - 29 Lincoln, Nebraska

 

HOW TO REGISTER:

Please contact Becky McHenry: (402)477-7501 ext. 527

 bmchenry@jawoollam.com
 

J.A. Woollam Home | Products | What's New | Sales & Support
Measurements | Resources | Site Map | About Us | Contact Us
 
J. A. Woollam Co., Inc.
645 M Street, Suite 102 Lincoln, NE 68508 USA
Telephone (402) 477-7501
FAX (402) 477-8214
E-mail: sales@jawoollam.com
©2005  J. A. Woollam Co., Inc.  All Rights Reserved.