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ご注意:
この商品は旧式で、現行モデルではございません。
参照用として、ここに掲載しております。 M-44の後継機種は、alpha-SEになります。 |
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M-44®
Fast, low cost spectroscopic
ellipsometer ideal for many common applications
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Our M-44® spectroscopic ellipsometers are inexpensive and easy
to use. These low cost instruments work well for many common or
routine measurements. The fast data acquisition make them ideal
for mapping or in-line applications. |
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The M-44® ellipsometers use patented technology to allow
simultaneous measurements of 44 wavelengths. The picture above
shows how white light is reflected off a graded and individual
wavelengths are incident on a 44 element diode array detector.
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Available Spectral Ranges |
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M-44®
UV |
280 to 600 nm (44
wavelengths) |
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M-44®
VIS |
410 to 750 nm (44
wavelengths) |
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M-44®
NIR |
600 to 1100 nm (44
wavelengths) |
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Available Options |
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Available Bases:
1. Fixed Angle (75ｰ), horizontal sample mount
2. Manually Adjustable Angle (45ｰ to 90ｰ), horizontal sample mount
3. Automated Angle (45ｰ to 90ｰ), vertical or horizontal sample mount |
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Sample Heating Stage
Control the temperature of your sample from room temperature
to 300ｺ C. Compatible with both vertical and
horizontal ellipsometer bases. |
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Automated Sample Translation:
100mm by 100mm XY (horizontal sample stage only)
200mm Rq
(horizontal sample stage only)
300mm Rq
(horizontal sample stage only) |
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Manual Sample Translation:
25mm by 25mm XY (horizontal sample stage only)
50mm by 50mm XY (horizontal sample stage only) |
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Focusing:
Decreases beam diameter to 100 microns (limited to wavelengths longer
than 350nm)
*Focusing optics detach for measurements with standard spot size. |
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