Ellipsometric Determination of Optical Constants for Silicon and Thermally Grown Silicon Dioxide via a Multi-sample, Multi-wavelength, Multi-angle Investigation

Authors: C. M. Herzinger, B. Johs, W. A. McGahan, J. A. Woollam, and W. Paulson

J. Appl. Phys., 83 (1998) 3323-3336.

Fundamental studies on large area Cu(In,Ga)Se2 films for high efficiency solar cells

Authors:  A. M. Hermann, C. Gonzalez, P. A. Ramakrishnan, D. Balzar, N. Popa, P. Rice, C. H. Marshall, J. N. Hilfiker, and T. Tiwald, P. J. Sebastian, M. E. Calixto, and R. N. Bhattacharya

Solar Energy Materials and Solar Cells, 70 (2001) 345-361.

Growth and characterization of large area Cu(In,Ga)Se2 films

Author: A. M. Hermann, C. Gonzalez, P. A. Ramakrishnan, D. Balzar, C. H. Marshall, J. N. Hilfiker, and T. Tiwald

Thin Solid Films, 387 (2001) 54-56.

Deposition factors and band gap of zinc-blende AlN

Authors: M. P. Thompson, G. W. Auner, T. S. Aheleva, K. A. Jones, S. J. Simko, and J. N. Hilfiker

J. Appl. Phys., 89 (2001) 3331-3336.

Optical Properties of Bulk and Thin-film SrTiO3 on Si and Pt

Authors: S. Zollner, A. A. Demkov, R. Liu, P. L. Fejes, R. B. Gregory, P. Alluri, J. A. Curless, Z. Yu, J. Ramdani, R. Droopad, T. E. Tiwald, J. N. Hilfiker, and J. A. Woollam

J. Vac. Sci. Technol. B, 18 (2000) 2242-2254.

Optical Constants of (Al0.98Ga0.02)xOy Native Oxides

Authors: K. J. Knopp, R. P. Mirin, D. H. Christensen, K. A. Bertness, A. Roshko, and R. A. Synowicki

Appl. Phys. Lett., 73 (1998) 3512-3514.

Infrared free carrier response of InGaAsSb epilayers on GaSb

Authors: P. G. Snyder, T. E. Tiwald, D. W. Thompson, N. J. Ianno, J. A. Woollam, M. G. Mauk, and Z. A. Shellenbarger

Thin Solid Films, 313-314 (1998) 667-670.