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1998 SID Intl. Symp. Technical Digest, XXIX (1998).

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Authors: R. A. Synowicki

Thin Solid Films, 313-314 (1998) 394-397.

Generalized transmission ellipsometry for twisted biaxial dielectric media: application to chiral liquid crystals

Authors: M. Schubert, B. Rheinlander, C. Cramer, H. Schmiedel, J. A. Woollam, C. M. Herzinger and B. Johs

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