Spectroscopic Ellipsometry for Data Storage Applications

Authors:  J. N. Hilfiker, R. Synowicki, J. S. Hale, and C. Bungay

DataTech, 1 (1998) 175-182

Carbon overcoats with controlled properties: Non-destructive Ellipsometry Evaluation

Authors:  W. A. McGahan, T. Makovicka, J. S. Hale, and J. A. Woollam

Surface and Coatings Technology, 62 (1993) 707-710.

Determination of the interfacial magneto-optical effects in Co/Pt multilayer structures

Author: 　X. Gao, D. W. Thompson, and J. A. Woollam

Appl. Phys. Lett., 70 (1997) 3203-3205.

Spectroscopic ellipsometry and magneto-optic Kerr effects in Co/Pt multilayers

Authors: X. Gao, D. W. Glenn, S. Heckens, D. W. Thompson, and J. A. Woollam

J. Appl. Phys., , 82 (1997) 4525-4530.

Optical and Magneto-Optical Constants of MnPt3

Authors: K. W. Wierman, J. N. Hilfiker, R. F. Sabiryanov, S. S. Jaswal, R. D. Kirby, and J. A. Woollam

Phys. Rev. B, 55 (1997) 3093-3099.